KEYSIGHT X1149 BOUNDARY SCAN

This tool which is known as Keysight X1149 Boundary Scan Development Tool, is helpful in developing quick and convenient Boundary Scan Test Vectors. Apart from many other benefits, it uses the standard 3070 board and the board_XY files, as well as the libraries developed for ICT (In-Circuit Tests). Test Development using this tool is a simple and straightforward process and also doesn’t consume much time. In the procedure, complex interconnect vectors and silicon nail vectors are generated along with the simple scan chain operation vectors that let operators debug with and thoroughly verify the devices on multiple standards. Our experts have extensive knowledge of the 3070 ICT development procedure and inter-transfer of test and knowledge vectors with the X1149 and the ICT 3070 Platform that allows them to proceed without any issues.

• Use of Boards for Development
• Board_XY Files for Development
• Use of ICT (In-Circuit) Libraries for Development
• Swift Test Vector Development and Debugging
• Debugging and Operations Tools for Ease of Use
• Multi-Tap Interface That Allows for Up to 4 Scan Chains
• Capability to Increase to 8 Scan Chains
• Low Voltage Adapter/Buffer Board for Low Voltage Application and Chain Separation
• Complete Logfile and Results Tracking for Production Tests
• Comprehensive Report Files for Overall Tests Coverage and Nodal Reduction Reports to Import into ICT for Probe Reduction